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IEEE EDS Webinar: A device to circuit framework for BTI, HCD aging
March 20 @ 11:45 am - 12:45 pm
Overview
Webinar EDS SCV/SF event, Topic: "A device to circuit framework for BTI, HCD aging ", Presenter: Dr. Souvik Mahapatra
"A device to circuit framework for BTI, HCD aging" Lecture by Dr. Souvik Mahapatra
The Electron Devices Society Santa Clara Valley/San Francisco joint Chapter and Device Reliability Physics committee are hosting Dr. Souvik Mahapatra.
When: Friday, March 20th, 2026 – 11:45AM to 1:15PM (PDT)
11:45AM – 12PM: Introduction
12PM-12:45PM: Lecture
12:45PM-12:55PM: Q&A
1PM Adjourn
Where: Zoom
Zoom
Join Zoom Meeting:
https://us06web.zoom.us/j/86948608699?pwd=sDcIAavzNqtsSSpFw4T46sb9f331od.1
Meeting ID: 869 4860 8699
Passcode: 506028
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Join instructions
https://us06web.zoom.us/meetings/86948608699/invitations?signature=u7Zd4xYAj-EoKdgIHXfc2f3mSFDMZ6U2UJrR7D8OKN8
Contact: ieeescveds at gmail.com
Speaker: Dr. Souvik Mahapatra
Abstract:
The benefit of performance gain per power is shrinking at advanced technology nodes. Several factors are responsible for this – including increased thermals, parasitics and aging issues. The traditional approach of treating aging as an afterthought with blanket guardbanding requires careful attention. In this talk we will propose a physics based device aging framework and its implementation in a circuit aging simulation platform. The framework can handle circuit aging under actual mission profiles (input activity and turbo-throttle conditions). Several possible approaches towards realistic / functional input based aging aware design modifications will be explored.
Virtual: https://events.vtools.ieee.org/m/546751