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This talk will explore the challenges and opportunities for building a technology business in a post-COVID world, with a focus on the perspective of venture capitalists, but targeting the entrepreneur. Topics include the impact of the pandemic on consumer behavior and business models, shifts in investment trends, and strategies for navigating the current economic environment. Overall, the talk will aim to provide actionable insights for entrepreneurs looking to build technology businesses in the post-pandemic world. Speaker(s): Kostas Mallios, Virtual: https://events.vtools.ieee.org/m/346307 |
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2 events,
Two free pre-symposium tutorials: One Profiling the Open Chiplets Economy (1:00 PM); the other on three NIST-sponsored Roadmaps (2:30 PM); no registration fee. In-Person only, in Milpitas, CA USA. (Register separately if you wish to attend the HI Symposium, at: (https://events.vtools.ieee.org/m/336609) For program updates, speaker names and topics, etc, visit : https://r6.ieee.org/scv-eps/?p=3003 Bldg: (in-person only), SEMI World Hdqtrs, 673 S Milpitas Blvd, Milpitas, California, United States, 95035
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Abstract: Conventional gas sensors are designed as zero-order analytical instruments with a single-output response (e.g. resistance, current, light intensity). Under variable ambient conditions such sensors suffer from cross-sensitivity from interferent gases and from fluctuations (drift) of their response because single-output sensor designs mathematically do not allow gas-selectivity and/or drift correction. We break this status quo by developing a new generation of gas sensors, known as multivariable sensors with several independent responses. By our designs, these sensors are first-order analytical instruments. In this talk, we will show that individual multivariable gas sensors quantify several gases and reject interferences, which is mathematically not feasible using conventional sensor designs. Next, we will show that such multivariable gas sensors have the ability for self-correction for sensor drift. Our multivariable gas sensors operate in the radio-frequency (RF) and optical portions of the electromagnetic spectrum. We self-correct for the baseline drift by sensor operation at more than one frequency of wavelength. Our approach for the drift self-correction should allow implementations of gas sensors in diverse applications that cannot afford weekly, monthly, or quarterly periodic maintenance, typical of traditional analytical instruments. Speaker(s): Dr. Radislav A. Potyrailo, Agenda: 6:30 – 6:50 PM Zoom Registration & Networking 6:50 – 7:00 PM Announcements & Polling 7:00 – 7:45 PM Invited Talk 7:45 – 8:00 PM Questions & Answers Virtual: https://events.vtools.ieee.org/m/347326 |
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Future Vision for Heterogeneous Integration from Global Perspectives, 2 days, 8 plenary talks, working groups ... Invited Plenary Presentations "Critical Issues in Electronics Resurgence for next decade & beyond"; Key messages from groupings of the HIR Chapters (with cross-TWG panels); Cross TWG Collaboration & Dialogue; Planning for 2023 conference events, workshops & collaboration. Register SEPARATELY for the two pre-symposium tutorials on Chiplets, and on NIST-sponsored Roadmaps at: https://events.vtools.ieee.org/m/339402 For updated program information visit: https://r6.ieee.org/scv-eps/?p=3003 SEMI World Hdqtrs, 673 S Milpitas Blvd, Milpitas, California, United States, 95035, Virtual: https://events.vtools.ieee.org/m/336609 Persistent memories are finding many uses in embedded devices and in various computing applications. NOR and SRAM have scaling limits that favor new memory technologies for smaller lithographic nodes such as MRAM and RRAM. In this talk we will explore important developments in memory technology including CXL and memory in chiplets that will transform computing. We will also look at how far persistent memories could go in the memory/storage hierarchy. URL's will be emailed to registered attendees two days, two hours and two minutes before the start of the meeting. Speaker(s): Tom Coughlin, Virtual: https://events.vtools.ieee.org/m/347592 |
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